Cluster, Optische Analytik, Informationsveranstaltung

Basics and applications of good SAXS: Quantifying the fine structure of lots of materials

16:00 till 17:00
OpTecBB e.V.

Dr. Frank Lerch

Tel.: +49 30 6392 1720

Web seminar within the scope of the focus area Optical Analytics

Speaker: Dr. Brian Pauw, BAM - Bundesanstalt für Materialforschung und -prüfung, Division 6.5 (Synthesis and Scattering of Nanostructured Materials)

About the online seminar

In contrast to the crisp, clear images you can get from electron microscopy, small-angle X-ray scattering (SAXS) patterns are rather featureless. These patterns, however, contain averaged structural information of all of the finest material structures that were illuminated by the X-ray beam. With careful and precise investigation, and supplementary information from complementary techniques, this bulk material structure can be quantified to reveal structural information spanning four or even five decades in size. Additionally, while the data correction and analysis is complex, sample preparation is very straightforward, also allowing for in-situ and operando measurements to be performed without breaking a sweat. In the right hands, then, this technique can be the most powerful tool in your analytical arsenal.

language: English.

tool: Cisco Webex platform.

Please register following the link on the right hand side until May, 25. We will keep you informed and send you the invitation link via Cisco Webex.